Investigation and comparison of the noise in the gate and substrate current after soft-breakdown

dc.contributor.author	Crupi, Felice
dc.contributor.author	Degraeve, Robin
dc.contributor.author	Groeseneken, Guido
dc.contributor.author	Nigam, Tanya
dc.contributor.author	Maes, Herman
dc.contributor.imecauthor	Degraeve, Robin
dc.contributor.imecauthor	Groeseneken, Guido
dc.date.accessioned	2021-10-06T10:51:05Z
dc.date.available	2021-10-06T10:51:05Z
dc.date.issued	1999
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/3323
dc.source.beginpage	2219
dc.source.endpage	2222
dc.source.issue	4B
dc.source.journal	Japanese Journal of Applied Physics. Part 1: Regular Papers
dc.source.volume	38
dc.title	Investigation and comparison of the noise in the gate and substrate current after soft-breakdown
dc.type	Journal article
dspace.entity.type	Publication
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