Publication:

The impact of self-heating and its implications on hot-carrier degradation-A modeling study

Date

2021

Journal article

https://doi.org/10.1016/j.microrel.2021.114156

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Author(s)

;

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Tyaginov, Stanislav

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Vaisman Chasin, Adrian

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Vandemaele, Michiel

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Grill, Alexander

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De Keersgieter, An

;

Linten, Dimitri

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Journal

MICROELECTRONICS RELIABILITY

Metrics

1978 since deposited on 2021-11-02

Acq. date: 2025-12-11