Publication:

The impact of self-heating and its implications on hot-carrier degradation-A modeling study

Date

2021
Journal article
https://doi.org/10.1016/j.microrel.2021.114156
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Author(s)

Makarov, A.
;
Jech, M.
;
Tyaginov, Stanislav  
;
Vaisman Chasin, Adrian  
;
Bury, Erik  
;
Vandemaele, Michiel  
;
Grill, Alexander  
;
De Keersgieter, An  
;
Linten, Dimitri  
;
Kaczer, Ben  

Journal

MICROELECTRONICS RELIABILITY

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1980 since deposited on 2021-11-02
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Acq. date: 2026-02-27

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