Publication:
The impact of self-heating and its implications on hot-carrier degradation-A modeling study
| dc.contributor.author | Makarov, A. | |
| dc.contributor.author | Jech, M. | |
| dc.contributor.author | Tyaginov, Stanislav | |
| dc.contributor.author | Vaisman Chasin, Adrian | |
| dc.contributor.author | Bury, Erik | |
| dc.contributor.author | Vandemaele, Michiel | |
| dc.contributor.author | Grill, Alexander | |
| dc.contributor.author | De Keersgieter, An | |
| dc.contributor.author | Linten, Dimitri | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.imecauthor | Tyaginov, S. | |
| dc.contributor.imecauthor | Bury, E. | |
| dc.contributor.imecauthor | Vandemaele, M. | |
| dc.contributor.imecauthor | Grill, A. | |
| dc.contributor.imecauthor | De Keersgieter, A. | |
| dc.contributor.imecauthor | Linten, D. | |
| dc.contributor.imecauthor | Kaczer, B. | |
| dc.contributor.imecauthor | Tyaginov, Stanislav | |
| dc.contributor.imecauthor | Vaisman Chasin, Adrian | |
| dc.contributor.imecauthor | Bury, Erik | |
| dc.contributor.imecauthor | Vandemaele, Michiel | |
| dc.contributor.imecauthor | Grill, Alexander | |
| dc.contributor.imecauthor | De Keersgieter, An | |
| dc.contributor.imecauthor | Linten, Dimitri | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.orcidimec | Vaisman Chasin, Adrian::0000-0002-9940-0260 | |
| dc.contributor.orcidimec | Bury, Erik::0000-0002-5847-3949 | |
| dc.contributor.orcidimec | Vandemaele, Michiel::0000-0003-0740-4115 | |
| dc.contributor.orcidimec | Grill, Alexander::0000-0003-1615-1033 | |
| dc.contributor.orcidimec | De Keersgieter, An::0000-0002-5527-8582 | |
| dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.date.accessioned | 2021-11-23T09:19:42Z | |
| dc.date.available | 2021-11-02T16:01:02Z | |
| dc.date.available | 2021-11-23T09:19:42Z | |
| dc.date.issued | 2021 | |
| dc.identifier.doi | 10.1016/j.microrel.2021.114156 | |
| dc.identifier.issn | 0026-2714 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37869 | |
| dc.publisher | PERGAMON-ELSEVIER SCIENCE LTD | |
| dc.source.issue | 1 | |
| dc.source.journal | MICROELECTRONICS RELIABILITY | |
| dc.source.numberofpages | 9 | |
| dc.source.volume | 122 | |
| dc.subject.keywords | DISSOCIATION KINETICS | |
| dc.subject.keywords | GENERATION | |
| dc.subject.keywords | DEVICE | |
| dc.subject.keywords | PASSIVATION | |
| dc.subject.keywords | TRANSISTORS | |
| dc.subject.keywords | SCATTERING | |
| dc.subject.keywords | MECHANISM | |
| dc.subject.keywords | TRANSPORT | |
| dc.subject.keywords | DEFECTS | |
| dc.subject.keywords | NMOS | |
| dc.title | The impact of self-heating and its implications on hot-carrier degradation-A modeling study | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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