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Low-damage damascene patterning of SiOC(H) low-k dielectrics
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Low-damage damascene patterning of SiOC(H) low-k dielectrics
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Date
2005-06
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Struyf, Herbert
;
Hendrickx, Dirk
;
Van Olmen, Jan
;
Iacopi, Francesca
;
Richard, Olivier
;
Travaly, Youssef
;
Van Hove, Marleen
;
Boullart, Werner
;
Vanhaelemeersch, Serge
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1925
since deposited on 2021-10-16
Acq. date: 2025-12-15
Citations
Metrics
Views
1925
since deposited on 2021-10-16
Acq. date: 2025-12-15
Citations