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Low-frequency noise behavior at low temperature (80K-300K) of silicon passivated Ge pMOSFETs with high-K metal gate stack
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1982 since deposited on 2021-10-16
2last month
Acq. date: 2026-04-06
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Statistics
Views
1982 since deposited on 2021-10-16
2last month
Acq. date: 2026-04-06
Citations