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Low-frequency noise behavior at low temperature (80K-300K) of silicon passivated Ge pMOSFETs with high-K metal gate stack
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1979 since deposited on 2021-10-16
Acq. date: 2025-12-09
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Views
1979 since deposited on 2021-10-16
Acq. date: 2025-12-09
Citations