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Low-frequency noise behavior at low temperature (80K-300K) of silicon passivated Ge pMOSFETs with high-K metal gate stack
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1980 since deposited on 2021-10-16
Acq. date: 2026-02-26
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Statistics
Views
1980 since deposited on 2021-10-16
Acq. date: 2026-02-26
Citations