Publication:

Positive bias temperature instability evaluation in fully recessed gate GaN MIS-FETs

Date

2016

Proceedings Paper

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Files

33358.pdf 471.56 KB

Author(s)

;

;

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De Jaeger, Brice

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Bakeroot, Benoit

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Stoffels, Steve

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Van Hove, Marleen

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Groeseneken, Guido

;

Decoutere, Stefaan

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Acq. date: 2026-03-16