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Electron spin resonance probing of defects in Si foils fabricated by the SLIM-cut methods
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Electron spin resonance probing of defects in Si foils fabricated by the SLIM-cut methods
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Date
2014
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kepa, J.
;
Stesmans, Andre
;
Masolin, Alex
;
Simoen, Eddy
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Abstract
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1861
since deposited on 2021-10-22
Acq. date: 2025-12-10
Citations
Metrics
Views
1861
since deposited on 2021-10-22
Acq. date: 2025-12-10
Citations