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Electron spin resonance probing of defects in Si foils fabricated by the SLIM-cut methods

Date

2014
Proceedings Paper
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dc.contributor.authorKepa, J.
dc.contributor.authorStesmans, Andre
dc.contributor.authorMasolin, Alex
dc.contributor.authorSimoen, Eddy
dc.contributor.imecauthorStesmans, Andre
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-22T02:34:07Z
dc.date.available2021-10-22T02:34:07Z
dc.date.embargo9999-12-31
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24049
dc.identifier.urlhttps://doi.org/10.1016/j.egypro.2013.12.004
dc.source.beginpage16
dc.source.conferenceE-MRS Spring Meeting 2013 Symposium D: Advanced Inorganic Materials and Structures for Photovoltaics
dc.source.conferencedate27/05/2013
dc.source.conferencelocationStrasbourg France
dc.source.endpage22
dc.title

Electron spin resonance probing of defects in Si foils fabricated by the SLIM-cut methods

dc.typeProceedings paper
dspace.entity.typePublication
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