Publication:
Low-frequency noise assessment of the oxide trap density in thick-oxide input-output transistors for DRAM applications
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1828 since deposited on 2021-10-23
2last month
Acq. date: 2026-02-26
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Views
1828 since deposited on 2021-10-23
2last month
Acq. date: 2026-02-26
Citations