Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Thickness dependent residual stress in sputtered AlN thin films
Publication:
Thickness dependent residual stress in sputtered AlN thin films
Copy permalink
Date
2012
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Pobedinskas, Paulius
;
Bolsée, J.C.
;
Dexters, W.
;
Ruttens, Bart
;
Mortet, Vincent
;
D'Haen, Jan
;
Manca, Jean
;
Haenen, Ken
Journal
Thin Solid Films
Abstract
Description
Metrics
Views
1925
since deposited on 2021-10-20
Acq. date: 2025-12-10
Citations
Metrics
Views
1925
since deposited on 2021-10-20
Acq. date: 2025-12-10
Citations