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Thickness dependent residual stress in sputtered AlN thin films
Publication:
Thickness dependent residual stress in sputtered AlN thin films
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Date
2012
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Pobedinskas, Paulius
;
Bolsée, J.C.
;
Dexters, W.
;
Ruttens, Bart
;
Mortet, Vincent
;
D'Haen, Jan
;
Manca, Jean
;
Haenen, Ken
Journal
Thin Solid Films
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1926
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Views
1926
since deposited on 2021-10-20
1
last month
1
last week
Acq. date: 2026-01-26
Citations