Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Book chapters
Investigation of tri-gate FinFETs by noise methods
Publication:
Investigation of tri-gate FinFETs by noise methods
Date
2011
Book Chapter
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
22917.pdf
1 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lukyanchikova, N.
;
Garbar, N.
;
Kudina, V.
;
Smolanka, A.
;
Simoen, Eddy
;
Claeys, Cor
Journal
Abstract
Description
Metrics
Views
1929
since deposited on 2021-10-19
Acq. date: 2025-10-25
Citations
Metrics
Views
1929
since deposited on 2021-10-19
Acq. date: 2025-10-25
Citations