Publication:

Investigation of tri-gate FinFETs by noise methods

Date

2011
Book Chapter
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dc.contributor.authorLukyanchikova, N.
dc.contributor.authorGarbar, N.
dc.contributor.authorKudina, V.
dc.contributor.authorSmolanka, A.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-19T15:48:01Z
dc.date.available2021-10-19T15:48:01Z
dc.date.embargo9999-12-31
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19345
dc.source.beginpage287
dc.source.bookSemiconductor-On-Insulator Materials for Nanoelectronics Applications
dc.source.endpage306
dc.title

Investigation of tri-gate FinFETs by noise methods

dc.typeBook chapter
dspace.entity.typePublication
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