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A new method to calculate leakage current and its applications for sub-45nm MOSFETs
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A new method to calculate leakage current and its applications for sub-45nm MOSFETs
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Date
2005
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lujan, Guilherme
;
Magnus, Wim
;
Soree, Bart
;
Pourghaderi, Mohammad Ali
;
Veloso, Anabela
;
Van Dal, Mark
;
Lauwers, Anne
;
Kubicek, Stefan
;
De Gendt, Stefan
;
Heyns, Marc
;
De Meyer, Kristin
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1938
since deposited on 2021-10-16
Acq. date: 2025-12-09
Citations
Metrics
Views
1938
since deposited on 2021-10-16
Acq. date: 2025-12-09
Citations