Publication:

A new method to calculate leakage current and its applications for sub-45nm MOSFETs

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1941 since deposited on 2021-10-16
Acq. date: 2026-03-17

Citations

Statistics

Views

1941 since deposited on 2021-10-16
Acq. date: 2026-03-17

Citations