Publication:
Understanding the Slow Erase Operation in IGZO-Channel FeFETs: The Role of Positive Charge Generation Kinetics
| dc.contributor.author | Chen, Zhuo | |
| dc.contributor.author | Ronchi, Nicolo | |
| dc.contributor.author | Izmailov, Roman | |
| dc.contributor.author | Tang, Hongwei | |
| dc.contributor.author | Popovici, Mihaela Ioana | |
| dc.contributor.author | Dekkers, Harold | |
| dc.contributor.author | Pavel, Alexandru | |
| dc.contributor.author | Bosch, Geert Van den | |
| dc.contributor.author | Rosmeulen, Maarten | |
| dc.contributor.author | Afanas'Ev, Valeri V. | |
| dc.contributor.author | Van Houdt, Jan | |
| dc.contributor.imecauthor | Chen, Zhuo | |
| dc.contributor.imecauthor | Ronchi, Nicolo | |
| dc.contributor.imecauthor | Izmailov, Roman | |
| dc.contributor.imecauthor | Tang, Hongwei | |
| dc.contributor.imecauthor | Popovici, Mihaela Ioana | |
| dc.contributor.imecauthor | Dekkers, Harold | |
| dc.contributor.imecauthor | Pavel, Alexandru | |
| dc.contributor.imecauthor | Bosch, Geert Van den | |
| dc.contributor.imecauthor | Rosmeulen, Maarten | |
| dc.contributor.imecauthor | Afanas'Ev, Valeri V. | |
| dc.contributor.imecauthor | Van Houdt, Jan | |
| dc.contributor.orcidimec | Chen, Zhuo::0000-0002-7407-8885 | |
| dc.contributor.orcidimec | Ronchi, Nicolo::0000-0002-7961-4077 | |
| dc.contributor.orcidimec | Izmailov, Roman::0000-0003-1876-647X | |
| dc.contributor.orcidimec | Tang, Hongwei::0009-0005-1345-5551 | |
| dc.contributor.orcidimec | Popovici, Mihaela Ioana::0000-0002-9838-1088 | |
| dc.contributor.orcidimec | Dekkers, Harold::0000-0003-4778-5709 | |
| dc.contributor.orcidimec | Pavel, Alexandru::0009-0005-7802-6950 | |
| dc.contributor.orcidimec | Rosmeulen, Maarten::0000-0002-3663-7439 | |
| dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
| dc.date.accessioned | 2025-03-31T05:47:06Z | |
| dc.date.available | 2025-03-31T05:47:06Z | |
| dc.date.issued | 2025 | |
| dc.description.wosFundingText | This work was supported by the imec's Industrial Affiliation Program on Storage Memory Devices. | |
| dc.identifier.doi | 10.1109/JEDS.2025.3541418 | |
| dc.identifier.issn | 2168-6734 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/45462 | |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | |
| dc.source.beginpage | 245 | |
| dc.source.endpage | 251 | |
| dc.source.journal | IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY | |
| dc.source.numberofpages | 7 | |
| dc.source.volume | 13 | |
| dc.subject.keywords | MEMORY CHARACTERISTICS | |
| dc.title | Understanding the Slow Erase Operation in IGZO-Channel FeFETs: The Role of Positive Charge Generation Kinetics | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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