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Photoresist absorption measurement at extreme ultraviolet (EUV) wavelength by thin film transmission method
Publication:
Photoresist absorption measurement at extreme ultraviolet (EUV) wavelength by thin film transmission method
Date
2019
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vesters, Yannick
;
Shehzad, Atif
;
De Simone, Danilo
;
Pollentier, Ivan
;
Nannarone, Stefano
;
Vandenberghe, Geert
;
De Gendt, Stefan
Journal
Journal of Photopolymer Science and Technology
Abstract
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1924
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Acq. date: 2025-10-24
Citations
Metrics
Views
1924
since deposited on 2021-10-27
418
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations