Publication:
Impact of the gate-electrode/dielectric interface on the low-frequency noise of thin gate oxide n-channel metal-oxide-semiconductor field-effect transistors
Date
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Srinivasan, Purushothaman | |
| dc.contributor.author | Misra, D. | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-16T15:20:33Z | |
| dc.date.available | 2021-10-16T15:20:33Z | |
| dc.date.issued | 2007 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/11883 | |
| dc.source.beginpage | 627 | |
| dc.source.endpage | 632 | |
| dc.source.issue | 4 | |
| dc.source.journal | Solid-State Electronics | |
| dc.source.volume | 51 | |
| dc.title | Impact of the gate-electrode/dielectric interface on the low-frequency noise of thin gate oxide n-channel metal-oxide-semiconductor field-effect transistors | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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