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Investigation on the temperature dependence of the dielectric constant of high-k materials for non-volatile memory applications
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Investigation on the temperature dependence of the dielectric constant of high-k materials for non-volatile memory applications
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Date
2010
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Arreghini, Antonio
;
Suhane, Amit
;
Van den Bosch, Geert
;
Breuil, Laurent
;
De Meyer, Kristin
;
Jurczak, Gosia
;
Van Houdt, Jan
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Acq. date: 2025-12-13
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Views
1921
since deposited on 2021-10-18
1
last month
1
last week
Acq. date: 2025-12-13
Citations