Publication:

Characterization of PVD TaN and ALD WNxCy copper diffusion barriers on a porous CVD low-k material

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1942 since deposited on 2021-10-15
Acq. date: 2026-01-07

Citations

Metrics

Views

1942 since deposited on 2021-10-15
Acq. date: 2026-01-07

Citations