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Cryogenic temperature DC-IV measurements and compact modeling of n-channel bulk FinFETs with 3-4 nm wide fins and 20 nm gate length for quantum computing applications
Publication:
Cryogenic temperature DC-IV measurements and compact modeling of n-channel bulk FinFETs with 3-4 nm wide fins and 20 nm gate length for quantum computing applications
Date
2021
Journal article
https://doi.org/10.1016/j.sse.2021.108089
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gupta, Sumreti
;
Rathi, Aarti
;
Parvais, Bertrand
;
Dixit, Abhisek
Journal
SOLID-STATE ELECTRONICS
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1813
since deposited on 2022-03-03
Acq. date: 2025-10-23
Citations
Metrics
Views
1813
since deposited on 2022-03-03
Acq. date: 2025-10-23
Citations