Publication:
Chemical profiling with photoemission: a comparison between angle-resolved XPS and high-energy photoemission on full gate stacks
Date
| dc.contributor.author | Conard, Thierry | |
| dc.contributor.author | Schram, Tom | |
| dc.contributor.author | Adelmann, Christoph | |
| dc.contributor.author | Woicik, J. | |
| dc.contributor.imecauthor | Conard, Thierry | |
| dc.contributor.imecauthor | Schram, Tom | |
| dc.contributor.imecauthor | Adelmann, Christoph | |
| dc.contributor.orcidimec | Conard, Thierry::0000-0002-4298-5851 | |
| dc.contributor.orcidimec | Schram, Tom::0000-0003-1533-7055 | |
| dc.contributor.orcidimec | Adelmann, Christoph::0000-0002-4831-3159 | |
| dc.date.accessioned | 2021-10-19T12:54:22Z | |
| dc.date.available | 2021-10-19T12:54:22Z | |
| dc.date.issued | 2011 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18723 | |
| dc.source.conference | 4th International Workshop on Hard X-ray Photoelectron Spectroscopy - HAXPES | |
| dc.source.conferencedate | 14/09/2011 | |
| dc.source.conferencelocation | Hamburg Germany | |
| dc.title | Chemical profiling with photoemission: a comparison between angle-resolved XPS and high-energy photoemission on full gate stacks | |
| dc.type | Meeting abstract | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |