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Accurate mapping of dose variations on EUV scanners using dose-to-clear exposures and optical ellipsometry
Publication:
Accurate mapping of dose variations on EUV scanners using dose-to-clear exposures and optical ellipsometry
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Date
2020
Proceedings Paper
https://doi.org/10.1117/12.2572993
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Nair, Vineet Vijayakrishnan
;
Van Look, Lieve
;
Aubert, Remko
;
Hendrickx, Eric
Journal
Proceedings of SPIE
Abstract
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Acq. date: 2025-12-12
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Views
1940
since deposited on 2021-11-02
2
last month
Acq. date: 2025-12-12
Citations