Publication:
Contribution of fast and slow states to negative bias temperature instabilities in Hf(x)Si(1-x)ON/TaN based pMOSFETs
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1832 since deposited on 2021-10-16
Acq. date: 2025-12-15
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Views
1832 since deposited on 2021-10-16
Acq. date: 2025-12-15
Citations