Publication:

Significant Enhancement of HCD and TDDB in CMOS FETs by Mechanical Stress

Date

2022
Proceedings Paper
https://doi.org/10.1109/irps48227.2022.9764540
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Author(s)

Lee, Kookjin  
;
Kaczer, Ben  
;
Kruv, Anastasiia  
;
Gonzalez, Mario  
;
Eneman, Geert  
;
Okudur, Oguzhan Orkut  
;
Grill, Alexander  
;
Franco, Jacopo  
;
Vici, Andrea  
;
Degraeve, Robin  
;
De Wolf, Ingrid  

Journal

na

Abstract

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