Publication:

Investigating the Current Collapse Mechanisms of p-GaN Gate HEMTs by Different Passivation Dielectrics

Date

2021

Journal article

https://doi.org/10.1109/TPEL.2020.3031680

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Author(s)

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Posthuma, Niels

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Bakeroot, Benoit

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Groeseneken, Guido

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Decoutere, Stefaan

Journal

IEEE TRANSACTIONS ON POWER ELECTRONICS

Metrics

1955 since deposited on 2022-02-24

Acq. date: 2026-01-07