Publication:
A systematic approach to RTN parameter fitting based on the Maximum Current Fluctuation
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.orcid | 0000-0003-2155-8305 | |
| cris.virtualsource.department | 060412a0-f333-4964-b692-f1ab550c24c1 | |
| cris.virtualsource.orcid | 060412a0-f333-4964-b692-f1ab550c24c1 | |
| dc.contributor.author | Saraza Canflanca, Pablo | |
| dc.contributor.author | Martin-Martinez, J. | |
| dc.contributor.author | Roca, E. | |
| dc.contributor.author | Castro-Lopez, R. | |
| dc.contributor.author | Rodriguez, R. | |
| dc.contributor.author | Nafria, M. | |
| dc.contributor.author | Fernandez, F. V. | |
| dc.date.accessioned | 2026-03-23T15:10:16Z | |
| dc.date.available | 2026-03-23T15:10:16Z | |
| dc.date.createdwos | 2025-11-06 | |
| dc.date.issued | 2022 | |
| dc.description.abstract | This paper addresses the automated parameter extraction of Random Telegraph Noise (RTN) models in nanoscale field-effect transistors. Unlike conventional approaches based on complex extraction of current levels and timing of trapping/de-trapping events from individual defects in current traces, the proposed approach performs a simple processing of current traces. A smart optimization problem formulation allows getting distribution functions of the amplitude of the current shifts and of the number of active defects vs. time. | |
| dc.description.wosFundingText | This work was supported in part by grants PID2019-103869RB-C31 and PID2019-103869RB-C32 funded by MCIN/AEI/ 10.13039/501100011033, and by grant US-1380876 funded by Consejeria de Economia, Conocimiento, Empresas y Universidad de la Junta de Andalucia and P.O. FEDER. | |
| dc.identifier.doi | 10.1109/smacd55068.2022.9816234 | |
| dc.identifier.issn | 2575-4874 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/58918 | |
| dc.language.iso | eng | |
| dc.provenance.editstepuser | greet.vanhoof@imec.be | |
| dc.publisher | IEEE | |
| dc.source.conference | 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) | |
| dc.source.conferencedate | 2022-06-12 | |
| dc.source.conferencelocation | Villasimius | |
| dc.source.journal | 2022 18TH INTERNATIONAL CONFERENCE ON SYNTHESIS, MODELING, ANALYSIS AND SIMULATION METHODS AND APPLICATIONS TO CIRCUIT DESIGN, SMACD | |
| dc.source.numberofpages | 4 | |
| dc.subject.keywords | TIME-DEPENDENT VARIABILITY | |
| dc.subject.keywords | STATISTICAL CHARACTERIZATION | |
| dc.title | A systematic approach to RTN parameter fitting based on the Maximum Current Fluctuation | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| imec.internal.crawledAt | 2025-11-20 | |
| imec.internal.source | crawler | |
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