Publication:
Defect profiling in the SiO2/Al2O3 interface using variable Tcharge-Tdischarge amplitude charge pumping (VT2ACP)
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1973 since deposited on 2021-10-18
Acq. date: 2025-10-23
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1973 since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations