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Conference contributions
Program charge interference and mitigation in vertically scaled single and multiple-channel 3D NAND flash memory
Publication:
Program charge interference and mitigation in vertically scaled single and multiple-channel 3D NAND flash memory
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Date
2021
Proceedings Paper
https://doi.org/10.1109/SISPAD54002.2021.9592552
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Verreck, Devin
;
Arreghini, Antonio
;
Van den Bosch, Geert
;
Furnemont, Arnaud
;
Rosmeulen, Maarten
Journal
na
Abstract
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1675
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Acq. date: 2025-12-16
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Metrics
Views
1675
since deposited on 2022-04-04
1
last month
Acq. date: 2025-12-16
Citations