Publication:
Program charge interference and mitigation in vertically scaled single and multiple-channel 3D NAND flash memory
| dc.contributor.author | Verreck, Devin | |
| dc.contributor.author | Arreghini, Antonio | |
| dc.contributor.author | Van den Bosch, Geert | |
| dc.contributor.author | Furnemont, Arnaud | |
| dc.contributor.author | Rosmeulen, Maarten | |
| dc.contributor.imecauthor | Verreck, Devin | |
| dc.contributor.imecauthor | Arreghini, Antonio | |
| dc.contributor.imecauthor | Van den Bosch, Geert | |
| dc.contributor.imecauthor | Furnemont, Arnaud | |
| dc.contributor.imecauthor | Rosmeulen, Maarten | |
| dc.contributor.orcidimec | Verreck, Devin::0000-0002-3833-5880 | |
| dc.contributor.orcidimec | Arreghini, Antonio::0000-0002-7493-9681 | |
| dc.contributor.orcidimec | Van den Bosch, Geert::0000-0001-9971-6954 | |
| dc.contributor.orcidimec | Furnemont, Arnaud::0000-0002-6378-1030 | |
| dc.contributor.orcidimec | Rosmeulen, Maarten::0000-0002-3663-7439 | |
| dc.date.accessioned | 2022-04-04T10:04:36Z | |
| dc.date.available | 2022-04-04T02:09:03Z | |
| dc.date.available | 2022-04-04T10:04:36Z | |
| dc.date.issued | 2021 | |
| dc.identifier.doi | 10.1109/SISPAD54002.2021.9592552 | |
| dc.identifier.eisbn | 978-1-6654-0685-7 | |
| dc.identifier.issn | 1946-1569 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39569 | |
| dc.publisher | IEEE | |
| dc.source.beginpage | 272 | |
| dc.source.conference | International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) | |
| dc.source.conferencedate | SEP 27-29, 2021 | |
| dc.source.conferencelocation | Dallas | |
| dc.source.endpage | 275 | |
| dc.source.journal | na | |
| dc.source.numberofpages | 4 | |
| dc.title | Program charge interference and mitigation in vertically scaled single and multiple-channel 3D NAND flash memory | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |