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Articles
Hot carrier degradation and time-dependent dielectric breakdown in oxides
Publication:
Hot carrier degradation and time-dependent dielectric breakdown in oxides
Date
1999
Journal article
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3439.pdf
1.65 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Groeseneken, Guido
;
Degraeve, Robin
;
Nigam, Tanya
;
Van den bosch, G.
;
Maes, Herman
Journal
Microelectronic Engineering
Abstract
Description
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1965
since deposited on 2021-10-06
Acq. date: 2025-10-23
Citations
Metrics
Views
1965
since deposited on 2021-10-06
Acq. date: 2025-10-23
Citations