Publication:

Hot carrier degradation and time-dependent dielectric breakdown in oxides

Date

1999
Journal article
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dc.contributor.authorGroeseneken, Guido
dc.contributor.authorDegraeve, Robin
dc.contributor.authorNigam, Tanya
dc.contributor.authorVan den bosch, G.
dc.contributor.authorMaes, Herman
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDegraeve, Robin
dc.date.accessioned2021-10-06T11:14:30Z
dc.date.available2021-10-06T11:14:30Z
dc.date.embargo9999-12-31
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3477
dc.source.beginpage27
dc.source.endpage40
dc.source.issue1_2
dc.source.journalMicroelectronic Engineering
dc.source.volume49
dc.title

Hot carrier degradation and time-dependent dielectric breakdown in oxides

dc.typeJournal article
dspace.entity.typePublication
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