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Degradation of the electrical performance and floating body effects in thin gate oxide PD-SOI MOSFETs by 2-MeV electron irradiation
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Degradation of the electrical performance and floating body effects in thin gate oxide PD-SOI MOSFETs by 2-MeV electron irradiation
Date
2005
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Matsuyama, K.
;
Hayama, K.
;
Takakura, K.
;
Yoneoka, M.
;
Ohyama, H.
;
Rafi, J.M.
;
Mercha, Abdelkarim
;
Simoen, Eddy
;
Claeys, Cor
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1951
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
1951
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations