Publication:

Degradation of the electrical performance and floating body effects in thin gate oxide PD-SOI MOSFETs by 2-MeV electron irradiation

Date

2005
Presentation
Simple item page Full metadata Statistics
 
dc.contributor.authorMatsuyama, K.
dc.contributor.authorHayama, K.
dc.contributor.authorTakakura, K.
dc.contributor.authorYoneoka, M.
dc.contributor.authorOhyama, H.
dc.contributor.authorRafi, J.M.
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-16T03:21:58Z
dc.date.available2021-10-16T03:21:58Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10871
dc.source.conference24th Electronic Materials Symposium - EMS-24
dc.source.conferencedate4/07/2005
dc.source.conferencelocationEhime Japan
dc.title

Degradation of the electrical performance and floating body effects in thin gate oxide PD-SOI MOSFETs by 2-MeV electron irradiation

dc.typeOral presentation
dspace.entity.typePublication
Files
Publication available in collections:
Presentations