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In-depth static and low frequency noise assessment of p-channel gate-all-around vertically stacked silicon nanosheets

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1244 since deposited on 2023-06-11
4last month
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Acq. date: 2026-08-04

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1244 since deposited on 2023-06-11
4last month
3last week
Acq. date: 2026-08-04

Citations