Publication:
In-depth static and low frequency noise assessment of p-channel gate-all-around vertically stacked silicon nanosheets
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1234 since deposited on 2023-06-11
2last month
Acq. date: 2025-12-10
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Views
1234 since deposited on 2023-06-11
2last month
Acq. date: 2025-12-10
Citations