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GaN HEMT with p-Type Schottky Gate: A Case Study of TCAD Modeling of the Gate Leakage Current

 
dc.contributor.authorErcolano, Franco
dc.contributor.authorTallarico, Andrea Natale
dc.contributor.authorMillesimo, Maurizio
dc.contributor.authorGnani, Elena
dc.contributor.authorReggiani, Susanna
dc.contributor.authorFiegna, Claudio
dc.contributor.authorBorga, Matteo
dc.contributor.authorPosthuma, Niels
dc.contributor.authorBakeroot, Benoit
dc.contributor.imecauthorBorga, Matteo
dc.contributor.imecauthorPosthuma, Niels
dc.contributor.imecauthorBakeroot, Benoit
dc.contributor.orcidimecBorga, Matteo::0000-0003-3087-6612
dc.contributor.orcidimecPosthuma, Niels::0000-0002-6029-1909
dc.contributor.orcidimecBakeroot, Benoit::0000-0003-4392-1777
dc.date.accessioned2025-06-05T08:58:38Z
dc.date.available2025-04-21T04:55:05Z
dc.date.available2025-06-05T08:58:38Z
dc.date.issued2024
dc.description.wosFundingTextPart of this work is funded by iRel40, a European co-funded innovation project that has been granted by the ECSEL Joint Undertaking (JU) under grant agreement No 876659. The funding of the project comes from the Horizon 2020 research programme and participating countries. National funding is provided by Germany, including the Free States of Saxony and Thuringia, Austria, Belgium, Finland, France, Italy, the Netherlands, Slovakia, Spain, Sweden, and Turkey.
dc.identifier.doi10.1007/978-3-031-48711-8_35
dc.identifier.eisbn978-3-031-48711-8
dc.identifier.issn1876-1100
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/45551
dc.publisherSPRINGER INTERNATIONAL PUBLISHING AG
dc.source.beginpage288
dc.source.conference54th Meeting of the Italian Electronics Society
dc.source.conferencedateSEP 06-08, 2023
dc.source.conferencelocationNoto
dc.source.endpage297
dc.source.journalLecture Notes in Electrical Engineering
dc.source.numberofpages10
dc.source.volume1113
dc.title

GaN HEMT with p-Type Schottky Gate: A Case Study of TCAD Modeling of the Gate Leakage Current

dc.typeProceedings paper
dspace.entity.typePublication
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