Publication:

Fault Attack Investigation on TaOx Resistive-RAM for Cyber Secure Application

Date

2023
Journal article
https://doi.org/10.1109/ted.2023.3289477
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Author(s)

Kumar, Ankit  
;
Degraeve, Robin  
;
Beckers, Arthur
;
Fantini, Andrea  
;
Verbauwhede, Ingrid
;
Linten, Dimitri  
;
Kar, Gouri Sankar  

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

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995 since deposited on 2023-08-07
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Acq. date: 2026-09-16

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