Publication:
Fault Attack Investigation on TaOx Resistive-RAM for Cyber Secure Application
| dc.contributor.author | Kumar, Ankit | |
| dc.contributor.author | Degraeve, Robin | |
| dc.contributor.author | Beckers, Arthur | |
| dc.contributor.author | Fantini, Andrea | |
| dc.contributor.author | Verbauwhede, Ingrid | |
| dc.contributor.author | Linten, Dimitri | |
| dc.contributor.author | Kar, Gouri Sankar | |
| dc.contributor.imecauthor | Kumar, Ankit | |
| dc.contributor.imecauthor | Degraeve, Robin | |
| dc.contributor.imecauthor | Fantini, Andrea | |
| dc.contributor.imecauthor | Linten, Dimitri | |
| dc.contributor.imecauthor | Kar, Gouri Sankar | |
| dc.contributor.orcidimec | Kumar, Ankit::0000-0002-1168-3287 | |
| dc.contributor.orcidimec | Fantini, Andrea::0000-0002-3220-8856 | |
| dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
| dc.date.accessioned | 2023-12-14T08:25:48Z | |
| dc.date.available | 2023-08-07T17:07:25Z | |
| dc.date.available | 2023-12-14T08:25:48Z | |
| dc.date.issued | 2023 | |
| dc.description.wosFundingText | This work was supported in part by the Cyber Security Research Flanders under Grant VR20192203.~ | |
| dc.identifier.doi | 10.1109/TED.2023.3289477 | |
| dc.identifier.issn | 0018-9383 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42293 | |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | |
| dc.source.beginpage | 4170 | |
| dc.source.endpage | 4177 | |
| dc.source.issue | 8 | |
| dc.source.journal | IEEE TRANSACTIONS ON ELECTRON DEVICES | |
| dc.source.numberofpages | 8 | |
| dc.source.volume | 70 | |
| dc.subject.keywords | MEMORY | |
| dc.title | Fault Attack Investigation on TaOx Resistive-RAM for Cyber Secure Application | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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