Publication:

Deep electron traps in HfO2-based ferroelectrics: (Al/Si-doped) HfO2 versus HfZrO4

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1748 since deposited on 2022-06-23
Acq. date: 2025-10-23

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1748 since deposited on 2022-06-23
Acq. date: 2025-10-23

Citations