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Conference contributions
Post-bond testing of 2.5D-SICs and 3D-SICs containing a passive silicon interposer base
Publication:
Post-bond testing of 2.5D-SICs and 3D-SICs containing a passive silicon interposer base
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Date
2011
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chi, Chun-Chuan
;
Marinissen, Erik Jan
;
Goel, Sandeep Kumar
;
Wu, Cheng-Wen
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Abstract
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1895
since deposited on 2021-10-19
Acq. date: 2026-07-17
Citations
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Views
1895
since deposited on 2021-10-19
Acq. date: 2026-07-17
Citations