Publication:
Challenges in the implentation of low-k dielectrics in the back-end of line
Date
| dc.contributor.author | Hoofman, Romano | |
| dc.contributor.author | Brom - Verheyden, Greja | |
| dc.contributor.author | Michelon, Julien | |
| dc.contributor.author | Iacopi, Francesca | |
| dc.contributor.author | Travaly, Youssef | |
| dc.contributor.author | Baklanov, Mikhaïl | |
| dc.contributor.author | Tokei, Zsolt | |
| dc.contributor.author | Beyer, Gerald | |
| dc.contributor.imecauthor | Hoofman, Romano | |
| dc.contributor.imecauthor | Brom - Verheyden, Greja | |
| dc.contributor.imecauthor | Tokei, Zsolt | |
| dc.contributor.imecauthor | Beyer, Gerald | |
| dc.contributor.orcidimec | Hoofman, Romano::0000-0001-8740-104X | |
| dc.date.accessioned | 2021-10-16T02:08:02Z | |
| dc.date.available | 2021-10-16T02:08:02Z | |
| dc.date.issued | 2005 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10602 | |
| dc.source.beginpage | 337 | |
| dc.source.endpage | 344 | |
| dc.source.journal | Microelectronic Engineering | |
| dc.source.volume | 80 | |
| dc.title | Challenges in the implentation of low-k dielectrics in the back-end of line | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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