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Assessing the performance of two-dimensional dopant profiling techniques
Publication:
Assessing the performance of two-dimensional dopant profiling techniques
Date
2003
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Duhayon, Natasja
;
Eyben, Pierre
;
Fouchier, Marc
;
Clarysse, Trudo
;
Vandervorst, Wilfried
;
Alvarez, David
;
Schoemann, S.
;
Ciappa, M.
;
Stangoni, M.
;
Fichtner, W.
;
Formanek, P.
;
Raineri, V.
;
Giannazzo, F.
;
Goghero, D.
;
Rosenwaks, Y.
;
Shikler, R.
;
Saraf, S.
;
Sadewasser, S.
;
Barreau, N.
;
Glatzel, T.
;
Verheijen, M.
;
Mentink, S.A.M.
;
von Sprekelsen, M.
;
Maltezopoulos, T.
;
Wiesendanger, R.
;
Hellemans, L.
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2039
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations
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Views
2039
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations