Publication:

Effect of the switching layer on CBRAM reliability and benchmarking against OxRAM devices

Date

2021
Journal article
https://doi.org/10.1016/j.sse.2021.108058
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Author(s)

Reale, G.
;
Belmonte, Attilio  
;
Fantini, Andrea  
;
Radhakrishnan, Janaki  
;
Redolfi, Augusto  
;
Devulder, Wouter  
;
Nyns, Laura  
;
Kundu, Shreya  
;
Delhougne, Romain  
;
Goux, Ludovic  
;
Kar, Gouri Sankar  

Journal

SOLID-STATE ELECTRONICS

Abstract

Description

Statistics

Views

1906 since deposited on 2021-11-02
2last month
Acq. date: 2026-08-08

Citations

Statistics

Views

1906 since deposited on 2021-11-02
2last month
Acq. date: 2026-08-08

Citations