Publication:

Effect of the switching layer on CBRAM reliability and benchmarking against OxRAM devices

Date

2021
Journal article
https://doi.org/10.1016/j.sse.2021.108058
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Author(s)

Reale, G.
;
Belmonte, Attilio  
;
Fantini, Andrea  
;
Radhakrishnan, Janaki  
;
Redolfi, Augusto  
;
Devulder, Wouter  
;
Nyns, Laura  
;
Kundu, Shreya  
;
Delhougne, Romain  
;
Goux, Ludovic  
;
Kar, Gouri Sankar  

Journal

SOLID-STATE ELECTRONICS

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1900 since deposited on 2021-11-02
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Acq. date: 2026-04-06

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