Publication:

Effect of the switching layer on CBRAM reliability and benchmarking against OxRAM devices

Date

2021

Journal article

https://doi.org/10.1016/j.sse.2021.108058

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Author(s)

;

Belmonte, Attilio

;

Fantini, Andrea

;

Radhakrishnan, Janaki

;

Redolfi, Augusto

;

Devulder, Wouter

;

;

;

Delhougne, Romain

;

;

Kar, Gouri Sankar

Journal

SOLID-STATE ELECTRONICS

Metrics

1892 since deposited on 2021-11-02

1last month

Acq. date: 2025-12-17