Publication:
Effect of the switching layer on CBRAM reliability and benchmarking against OxRAM devices
| dc.contributor.author | Reale, G. | |
| dc.contributor.author | Belmonte, Attilio | |
| dc.contributor.author | Fantini, Andrea | |
| dc.contributor.author | Radhakrishnan, Janaki | |
| dc.contributor.author | Redolfi, Augusto | |
| dc.contributor.author | Devulder, Wouter | |
| dc.contributor.author | Nyns, Laura | |
| dc.contributor.author | Kundu, Shreya | |
| dc.contributor.author | Delhougne, Romain | |
| dc.contributor.author | Goux, Ludovic | |
| dc.contributor.author | Kar, Gouri Sankar | |
| dc.contributor.imecauthor | Belmonte, Attilio | |
| dc.contributor.imecauthor | Fantini, Andrea | |
| dc.contributor.imecauthor | Radhakrishnan, Janaki | |
| dc.contributor.imecauthor | Redolfi, Augusto | |
| dc.contributor.imecauthor | Devulder, Wouter | |
| dc.contributor.imecauthor | Nyns, Laura | |
| dc.contributor.imecauthor | Kundu, Shreya | |
| dc.contributor.imecauthor | Delhougne, R. | |
| dc.contributor.imecauthor | Goux, Ludovic | |
| dc.contributor.imecauthor | Kar, G. S. | |
| dc.contributor.imecauthor | Belmonte, Attilio | |
| dc.contributor.imecauthor | Fantini, Andrea | |
| dc.contributor.imecauthor | Radhakrishnan, Janaki | |
| dc.contributor.imecauthor | Redolfi, Augusto | |
| dc.contributor.imecauthor | Devulder, Wouter | |
| dc.contributor.imecauthor | Nyns, Laura | |
| dc.contributor.imecauthor | Kundu, Shreya | |
| dc.contributor.imecauthor | Delhougne, Romain | |
| dc.contributor.imecauthor | Goux, Ludovic | |
| dc.contributor.imecauthor | Kar, Gouri Sankar | |
| dc.contributor.orcidimec | Devulder, Wouter::0000-0002-5156-0177 | |
| dc.contributor.orcidimec | Nyns, Laura::0000-0001-8220-870X | |
| dc.contributor.orcidimec | Goux, Ludovic::0000-0002-1276-2278 | |
| dc.contributor.orcidimec | Fantini, Andrea::0000-0002-3220-8856 | |
| dc.contributor.orcidimec | Kundu, Shreya::0000-0001-8052-7774 | |
| dc.date.accessioned | 2021-12-06T11:11:43Z | |
| dc.date.available | 2021-11-02T15:57:38Z | |
| dc.date.available | 2021-12-06T11:11:43Z | |
| dc.date.issued | 2021 | |
| dc.identifier.doi | 10.1016/j.sse.2021.108058 | |
| dc.identifier.issn | 0038-1101 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37624 | |
| dc.publisher | PERGAMON-ELSEVIER SCIENCE LTD | |
| dc.source.beginpage | 108058 | |
| dc.source.issue | na | |
| dc.source.journal | SOLID-STATE ELECTRONICS | |
| dc.source.numberofpages | 5 | |
| dc.source.volume | 184 | |
| dc.title | Effect of the switching layer on CBRAM reliability and benchmarking against OxRAM devices | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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