Publication:

CMOS integration of thermally stable diffusion and gate replacement (D&GR) high-k/metal gate stacks in DRAM periphery transistors

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

2047 since deposited on 2021-10-24
3last month
Acq. date: 2026-06-02

Citations

Statistics

Views

2047 since deposited on 2021-10-24
3last month
Acq. date: 2026-06-02

Citations