Publication:

CMOS integration of thermally stable diffusion and gate replacement (D&GR) high-k/metal gate stacks in DRAM periphery transistors

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

2056 since deposited on 2021-10-24
2last month
1last week
Acq. date: 2026-09-19

Citations

Statistics

Views

2056 since deposited on 2021-10-24
2last month
1last week
Acq. date: 2026-09-19

Citations