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Bias temperature instability effects in devices with fully-silicided gate stacks, strained-Si and multiple-gate architectures
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1945 since deposited on 2021-10-17
1last month
Acq. date: 2025-12-08
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Metrics
Views
1945 since deposited on 2021-10-17
1last month
Acq. date: 2025-12-08
Citations