Publication:

Electrical Stability of MOS Structures With AlON and Al2O3 Dielectrics Deposited on n-and p-Type GaN

Date

2024
Journal article
https://doi.org/10.1109/TED.2024.3422950
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Author(s)

Filho Goncalez, Walter  
;
Borga, Matteo  
;
Geens, Karen  
;
Khan, Md Arif  
;
Cingu, Deepthi  
;
Chatterjee, Urmimala  
;
Decoutere, Stefaan  
;
Knaepen, Werner
;
Kizir, Seda
;
Arnou, Panagiota
;
Bakeroot, Benoit  

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

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636 since deposited on 2024-08-05
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Acq. date: 2025-10-24

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Views

636 since deposited on 2024-08-05
484item.page.metrics.field.last-week
Acq. date: 2025-10-24

Citations