Publication:
Electrical Stability of MOS Structures With AlON and Al2O3 Dielectrics Deposited on n-and p-Type GaN
| dc.contributor.author | Filho Goncalez, Walter | |
| dc.contributor.author | Borga, Matteo | |
| dc.contributor.author | Geens, Karen | |
| dc.contributor.author | Khan, Md Arif | |
| dc.contributor.author | Cingu, Deepthi | |
| dc.contributor.author | Chatterjee, Urmimala | |
| dc.contributor.author | Decoutere, Stefaan | |
| dc.contributor.author | Knaepen, Werner | |
| dc.contributor.author | Kizir, Seda | |
| dc.contributor.author | Arnou, Panagiota | |
| dc.contributor.author | Bakeroot, Benoit | |
| dc.contributor.imecauthor | Borga, Matteo | |
| dc.contributor.imecauthor | Geens, Karen | |
| dc.contributor.imecauthor | Khan, Md Arif | |
| dc.contributor.imecauthor | Cingu, Deepthi | |
| dc.contributor.imecauthor | Chatterjee, Urmimala | |
| dc.contributor.imecauthor | Decoutere, Stefaan | |
| dc.contributor.imecauthor | Bakeroot, Benoit | |
| dc.contributor.imecauthor | Filho Goncalez, Walter | |
| dc.contributor.orcidimec | Borga, Matteo::0000-0003-3087-6612 | |
| dc.contributor.orcidimec | Geens, Karen::0000-0003-1815-3972 | |
| dc.contributor.orcidimec | Khan, Md Arif::0000-0003-4503-8136 | |
| dc.contributor.orcidimec | Cingu, Deepthi::0000-0002-3042-7289 | |
| dc.contributor.orcidimec | Chatterjee, Urmimala::0000-0002-8934-6774 | |
| dc.contributor.orcidimec | Decoutere, Stefaan::0000-0001-6632-6239 | |
| dc.contributor.orcidimec | Bakeroot, Benoit::0000-0003-4392-1777 | |
| dc.date.accessioned | 2024-10-09T09:24:41Z | |
| dc.date.available | 2024-08-05T18:18:29Z | |
| dc.date.available | 2024-10-09T09:24:41Z | |
| dc.date.issued | 2024 | |
| dc.identifier.doi | 10.1109/TED.2024.3422950 | |
| dc.identifier.issn | 0018-9383 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/44269 | |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | |
| dc.source.beginpage | 5212 | |
| dc.source.endpage | 5217 | |
| dc.source.issue | 9 | |
| dc.source.journal | IEEE TRANSACTIONS ON ELECTRON DEVICES | |
| dc.source.numberofpages | 6 | |
| dc.source.volume | 71 | |
| dc.subject.keywords | ISSUES | |
| dc.title | Electrical Stability of MOS Structures With AlON and Al2O3 Dielectrics Deposited on n-and p-Type GaN | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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