Publication:
Advanced characterisation : an indispensable tool for ultra clean processing
Date
| dc.contributor.author | Vandervorst, Wilfried | |
| dc.contributor.author | Bender, Hugo | |
| dc.contributor.author | Storm, Wolfgang | |
| dc.contributor.author | Heyns, Marc | |
| dc.contributor.author | Polleunis, C. | |
| dc.contributor.author | Bertrand, P. | |
| dc.contributor.imecauthor | Vandervorst, Wilfried | |
| dc.contributor.imecauthor | Bender, Hugo | |
| dc.contributor.imecauthor | Heyns, Marc | |
| dc.date.accessioned | 2021-09-29T13:21:02Z | |
| dc.date.available | 2021-09-29T13:21:02Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 1995 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/961 | |
| dc.source.beginpage | 27 | |
| dc.source.endpage | 34 | |
| dc.source.issue | 1_4 | |
| dc.source.journal | Microelectronic Engineering | |
| dc.source.volume | 28 | |
| dc.title | Advanced characterisation : an indispensable tool for ultra clean processing | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | Original bundle
| |
| Publication available in collections: |