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Direct yield prediction from SEM images
Publication:
Direct yield prediction from SEM images
Date
2023
Proceedings Paper
https://doi.org/10.1117/12.2658294
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Choona, Lilach
;
Linshiz, Jasmine
;
Pres, Shaul
;
Levant, Boris
;
Tal, Noam
;
Santoro, Gaetano
;
Baudot, Sylvain
;
Opdebeeck, Ann
;
Reifsnider, Jason
;
Vadakupudhu Palayam, Senthil
;
Lorusso, Gian
;
Mitard, Jerome
;
Yogev, Shay
Journal
Proceedings of SPIE
Abstract
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756
since deposited on 2023-07-28
Acq. date: 2025-10-23
Citations
Metrics
Views
756
since deposited on 2023-07-28
Acq. date: 2025-10-23
Citations