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Atomic and electrical characterisation of amorphous silicon passivation layers
Publication:
Atomic and electrical characterisation of amorphous silicon passivation layers
Date
2012
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
O'Sullivan, Barry
;
Thoan, N.H.
;
Jivanescu, M.
;
Pantisano, Luigi
;
Bearda, Twan
;
Dross, Frederic
;
Gordon, Ivan
;
Afanasiev, Valeri
;
Stesmans, Andre
;
Poortmans, Jef
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1967
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations
Metrics
Views
1967
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations