Publication:

Atomic and electrical characterisation of amorphous silicon passivation layers

Date

2012
Proceedings Paper
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dc.contributor.authorO'Sullivan, Barry
dc.contributor.authorThoan, N.H.
dc.contributor.authorJivanescu, M.
dc.contributor.authorPantisano, Luigi
dc.contributor.authorBearda, Twan
dc.contributor.authorDross, Frederic
dc.contributor.authorGordon, Ivan
dc.contributor.authorAfanasiev, Valeri
dc.contributor.authorStesmans, Andre
dc.contributor.authorPoortmans, Jef
dc.contributor.imecauthorO'Sullivan, Barry
dc.contributor.imecauthorGordon, Ivan
dc.contributor.imecauthorAfanasiev, Valeri
dc.contributor.imecauthorStesmans, Andre
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.orcidimecO'Sullivan, Barry::0000-0002-9036-8241
dc.contributor.orcidimecGordon, Ivan::0000-0002-0713-8403
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.date.accessioned2021-10-20T14:08:49Z
dc.date.available2021-10-20T14:08:49Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21239
dc.source.beginpage185
dc.source.conferenceProceedings of the 2nd International Conference on Crystalline Silicon Photovoltaics - Silicon PV
dc.source.conferencedate3/04/2012
dc.source.conferencelocationLeuven Belgium
dc.source.endpage190
dc.title

Atomic and electrical characterisation of amorphous silicon passivation layers

dc.typeProceedings paper
dspace.entity.typePublication
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